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9780080531380 - Y-P Zhao, G. C. Wang: Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications - 书

(?):

Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications (2000) (?)

从交货: 荷兰本书是英语语言中新书电子书、 电子书、 电子书
ISBN:

9780080531380 (?) 或 0080531385

, Band: 37, 在英语中, Academic Press, 新增功能, 电子书
The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth. In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37 , Characterization of Amorphous and Crystalline Rough Surface-Pri... The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth. In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37 , Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary nature of the real space and diffraction techniques is fully displayed. It includes an accessible description of quantitative characterization of random rough surfaces and growth/etch fronts. It has a detailed description of the principles, experimentation, and limitations of advanced real-space imaging techniques (such as atomic force microscopy) and diffraction techniques (such as light scattering, X-ray diffraction, and electron diffraction). It has characterization of a variety of rough surfaces (E.g., self-affine, mounded, anisotropic, and two-level surfaces) accompanied by quantitative examples to illustrate the essence of the principles. It is an insightful description of how rough surfaces are formed. There is presentation of the most recent examples of the applications of rough surfaces in various areas. Productinformatie:Taal: Engels;Vertaald uit het: Engels;Formaat: ePub met kopieerbeveiliging (DRM) van Adobe;Bestandsgrootte: 16.71 MB;Kopieerrechten: Het kopiëren van (delen van) de pagina's is niet toegestaan ;Printrechten: Het printen van de pagina's is niet toegestaan;Voorleesfunctie: De voorleesfunctie is uitgeschakeld;Geschikt voor: Alle e-readers te koop bij bol.com (of compatible met Adobe DRM). Telefoons/tablets met Google Android (1.6 of hoger) voorzien van bol.com boekenbol app. PC en Mac met Adobe reader software;ISBN10: 0080531385;ISBN13: 9780080531380; Engels | Ebook | 2000
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类别: School en studie, Exacte wetenschappen, Chemie /, School en studie, Techniek en technologie, Materiaalkunde /, School en studie, Exacte wetenschappen, Meer exacte wetenschappen /, School en studie, Exacte wetenschappen, Natuurkunde
从数据 2016-06-09 10:30h
ISBN (替代符号): 0-08-053138-5, 978-0-08-053138-0
档案条目:
9780080531380 - Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications - 书

Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications (?)

从交货: 德国本书是英语语言中新书电子书、 电子书、 电子书数字下载的产品
ISBN:

9780080531380 (?) 或 0080531385

, 在英语中, Pergamon; Pergamon Press, Vereinigte Staaten von Amerika, 新增功能, 电子书, 数字下载
类别: eBooks > Belletristik > Erzählungen
关键字: EXPERIMENTS TECHNIQUES ,PHYSICS ,CHEMISTRY ,MATERIALS SCIENCE ,NATURWISSENSCHAFTEN ALLGEMEIN
从数据 2016-06-09 10:30h
ISBN (替代符号): 0-08-053138-5, 978-0-08-053138-0

9780080531380

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可用的善本、 用过的书和二手书的标题 "Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications" 从 Y-P Zhao, G. C. Wang 完全列出。

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